Tuesday, February 16, 2010

Fetal and Neonatal Pathology, 4th ed. 2007

Jean W. Keeling and T. Yee Khong
ISBN: 978-1-84628-524–0
e-ISBN: 978-1-84628-743-5
Springer




Fetal and Neonatal Pathology is the Fourth Edition of what has become the classic reference in the field of fetal and neonatal pathology. Fully revised and up-dated, the book retains the overall format of previous editions, presenting the same practical approach to the examination of both fetuses and perinatal deaths. It provides essential clinical and pathophysiological information and discusses the pathogenesis of abnormalities as a basis for appropriate methods of investigation.



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